NenoVision develops and produces LiteScope, an AFM-in-SEM instrument that integrates atomic force microscopy (AFM) with scanning electron microscopy (SEM) for in-situ, multimodal and correlative analysis of microscopic samples
NenoVision develops and produces LiteScope, an AFM-in-SEM instrument that integrates atomic force microscopy (AFM) with scanning electron microscopy (SEM) for in-situ, multimodal and correlative analysis of microscopic samples. Its instruments and accessories support nanoscale characterization and semiconductor failure analysis, as well as research in battery and energy materials, materials science, and life science.